BS EN 60749-11-2002 半导体装置.机械和气候试验方法.温度速变.双流体浸泡法

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【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Rapidchangeoftemperature-Two-fluid-bathmethod
【原文标准名称】:半导体装置.机械和气候试验方法.温度速变.双流体浸泡法
【标准号】:BSEN60749-11-2002
【标准状态】:现行
【国别】:英国
【发布日期】:2002-09-24
【实施或试行日期】:2002-09-24
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:气候;环境试验;电子设备及元件;电学测量;半导体器件;集成电路;机械试验;半导体;电子工程;测试;气候试验;电气工程;定义;温度变化;元部件
【英文主题词】:Changesoftemperature;Climate;Climatictests;Components;Definitions;Destructivetesting;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Mechanicaltesting;Semiconductordevices;Semiconductors;Testing
【摘要】:ThispartofIEC60749definestherapidchangeoftemperaturetestmethodandthetwo-fluid-bathmethod.Whenbothtestmethodsareperformedaspartofadevicequalification,resultsofairtoairtemperaturecyclingtakepriorityoverthistwo-fluid-bathtestmethod.Thistestmethodmayalsobeused,employingfewercycles(e.g.5to10cycles),totesttheeffectofimmersioninheatedliquidsthatareusedforthepurposeofcleaningdevices.Thistestisapplicabletoallsemiconductordevices.Itisconsidereddestructiveunlessotherwisedetailedintherelevantspecification.Ingeneral,thisrapidchangeoftemperatureandtwo-fluidbathmethodtestisinconformitywithIEC60068-2-14but,duetospecificrequirementsofsemiconductors,theclausesofthisstandardapply.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:12P;A4
【正文语种】:英语